Control of the ion beam is gained through the Unix workstation and fabrication software system that is designed to support both TEM sample preparation and pattern milling. The FB-2000A can be ...

Since it is a site-specific technique, FIB-SEM will not cause damage outside of the targeted areas. Multiple TEM samples can ...

FIB etching/deposition, e-beam lithography, and chemical analysis in 2D and 3D. The system is capable of various sample preparations and advanced analysis, including porous analysis for rock samples ...

We are pioneering research into new technologies that enable materials to be tested inside electron/ion microscopes (FIB/SEM/TEM), so that their mechanical and electrical properties can be measured at ...

and electrical probing with the Helios SEM/FIB both managed by 4DLabs are being investigated. However, Lorentz microscopy is no longer available. The Helium ion microscope (HIM, Zeiss Nanofab) remains ...