Combine scanning electron microscopy and elemental analytics: the best-in-class EDS geometry of Sigma increases your analytical productivity, especially on beam sensitive samples. Get analytical ...

Recent research by scientists from Technion, the University of Stuttgart, and the University of Duisburg-Essen has further ...

Prof. Dan Shechtman of the Technion - Israel Institute of Technology made the discovery that would later earn him the 2011 ...

We are seeing several issues affecting the semiconductor industry as we enter the new year with geopolitical volatility and ...

Sensitivity and specificity of DECT for diagnosing gout was calculated against a combined reference standard (polarising and electron microscopy of synovial fluid). To explore the diagnostic yield of ...

Using a STEM-in-SEM conversion holder, we can convert a scanning electron microscope into a scanning transmission microscope.

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When all you’ve got is a hammer, everything looks like a nail. And when you’ve got a scanning electron microscope, everything must look like a sample that would be really, really interesting ...

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Transmission electron microscopy generates an image of the internal structure of a thin sample. Scanning electron microscopy generates a topological image of a sample. PRC2-dependent H3K27 ...