JEOL patented High sensitivity backscattered electron detector can detect composition, topography, and shadowed images simply with a selection on the operation menu.

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The JSM-6390 is a high-performance, low cost, scanning electron microscope with a high resolution of 3.0nm. The customizable GUI interface allows the instrument to be intuitively operated, and Smile Shot™ software ensures optimum operation settings.

View and Download JEOL JSM-6390 LA user manual online. Scanning Electron Microscope. JSM-6390 LA microscope pdf manual download.

jsm-6390／jsm-6390lvに日本電子製元素分析装置を融合し、快適な操作環境を提供します。 観察から分析までをシームレスに実行できます。 JSM-6390LAでは、非導電性試料も、そのまま観察分析できます。

Manuals and User Guides for JEOL JSM-6390 LA. We have 1 JEOL JSM-6390 LA manual available for free PDF download: User Manual

Jan 19, 2025 · JEOL SEM with EDAX EDS detector in great condition. APEX software with MAPPING. Backscatter detector - all 4 quadrant's working.

User Manuals, Guides and Specifications for your JEOL JSM-6390 LA Microscope. Database contains 1 JEOL JSM-6390 LA Manuals (available for free online viewing or downloading in PDF): Operation & user’s manual .

JEOL JSM-6390 LA: User Manual | Brand: JEOL | Category: Microscope | Size: 62.27 MB | Pages: 68

The JSM-6390 is a scanning electron microscope (SEM) manufactured by JEOL. It is designed for high-resolution imaging and analysis of a wide range of materials. The JSM-6390 utilizes a thermionic electron gun and provides magnification up to 300,000x.