"NEOARM" / JEM-ARM200F comes with JEOL’s unique cold field emission gun (Cold FEG) and a new Cs corrector (ASCOR) that compensates for higher order aberrations. The combination of …

JEOL COSMO™は、新しい収差アルゴリズム (SRAM： Segmented Ronchigram Auto-correction function Matrix) を採用したことにより、収差補正のための標準試料に入れ替えなくとも、高 …

JEM-ARM300F GRAND ARM is an Atomic Resolution Electron Microscope offering a maximum accelerating voltage of 300 kV, and equipped with JEOL’s own Cs Correctors. This instrument …

The "GRAND ARM™2" has been upgraded. This new "GRAND ARM™2" enables observation at ultrahigh spatial resolution with highly sensitive analysis over a wide range of accelerating …

The JEOL ARM series, with spherical aberration correction, has become the leading Atomic Resolution Microscope for advanced research. Learn more here.

The new JEOL JEM-ARM300F2 Grand ARM™2 has been optimized for ultrahigh resolution imaging, down to the picometer level, combined with highly sensitive EDX and high-resolution …

The ARM™ 200F Monochromator features a Spot-in-Spot-out double Wein for ultrahigh-energy resolution EELS Analysis of materials. Learn more here.

NEOARM / JEM-ARM200F comes with JEOL’s unique cold field emission gun (Cold FEG) and a new Cs corrector (ASCOR) that compensates for higher order aberrations.

JEM-ARM200F ACCELARM is an Atomic Resolution Analytical Electron Microscope, which boasts an unprecedented STEM-HAADF resolution of 78 pm with a STEM Cs corrector …

Its uniqueness lies in its atomic resolution imaging and analytical characterization capabilities which are aided by energy dispersive X-ray spectroscopy, electron energy loss spectroscopy …