JEOL has extended an atmospheric-pressure SPM to an environmental SPM, the JSPM-5200. This SPM flexibly controls the sample environment, enabling you to observe samples not only in vacuum, controlled atmospheres and liquid, but also while heating or cooling them.

View and Download JEOL JSPM-5200 instructions manual online. SCANNING PROBE MICROSCOPE. JSPM-5200 microscope pdf manual download.

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JEOL JSM 5200 is a high performance, scanning electron microscope (SEM). It combines the efficient capabilities of a variable pressure SEM with those of a high resolution SEM, providing researchers with unparalleled convenience and precision.

Jun 3, 2024 · We will then arrange the booking and pick-up service. Made in Japan.

The Extended Lock-in Amplifier allows the JSPM-5200 to offer four measurement modes of SKPM, LM-FFM, VE-AFM and SCFM. Topographic image, surface potential image

To set the frequency of the cantilever beam to the resonant fre-quency any time, PLL (Phase Locked Loop) is used. The FM detection method with PLL is a standard configuration of JEOL SPMs, which is an unprecedented feature of JEOL SPMs. In Non-Contact mode, an image is obtained without damaging the sample surface.

Manuals and User Guides for JEOL JSPM-5200. We have 1 JEOL JSPM-5200 manual available for free PDF download: Instructions Manual

The open architecture of the JSPM-5200 provides multiple access ports and easy access to the probe. The JSPM-5200 can be configured as either an atomic force microscope (AFM) or scanning tunneling microscope (STM) by merely changing the tip.

JEOL JSM 5200 is a scanning electron microscope designed for both superior resolution and low background noise. It is capable of high-contrast imaging of nanostructures with a resolution of 0.6 nm in the secondary electron (SE) mode and a minimum …