
XRD pattern of the as-prepared SnS 2 sample. - ResearchGate
SnS2 nanoparticles have been synthesized using a mild hydrothermal method in the presence of the surfactant sodium dodecyl sulfate (SDS) at 180 °C for 12 h. Physical investigations were carried...
X-ray diffraction (XRD) pattern of the PS-SnS2-x, indexed to the...
We report, for the first time, the photochemical synthesis of 2D tin di/sulfide (PS-SnS2-x, x = 0 or 1) from thioacetamide (TAA) and tin (IV) chloride in an aqueous system. The synthesized...
Structural, optical and magnetic properties of SnS2 …
Oct 30, 2020 · The XRD pattern of the SnS 2 nanoparticles synthesised at different hydrothermal reaction temperatures for 6 h is shown in Fig. 1 a. All detected diffraction peaks can be systematically indexed to the hexagonal SnS 2 (JCPDS No. 01-077-3355) for the sample synthesised at 180 °C.
XRD patterns of SnO2, SnS2 and (a) SnS2/SnO2-A, (b) SnS2…
Here, we elucidate the unique inhomogeneous oxidation process of ultrathin SnS2 nanoflowers and demonstrate the novel growth evolution pattern of oxidation generated SnO2 nanoparticles.
Growth and characterization of tin disulfide (SnS2) thin film …
Jun 14, 2007 · X-ray diffraction (XRD) patterns reveal that the deposited SnS 2 thin films have hexagonal crystal structure. Energy dispersive X-ray analysis (EDAX) indicated elemental ratio close to those for tin disulfide (SnS (2.02) ).
Phase-controlled synthesis of SnS2 and SnS flakes and …
May 11, 2022 · The sharp XRD pattern demonstrates the highly crystalline nature of the obtained SnS 2 flakes, and the dominance of the (001) peaks suggests that the SnS 2 flakes grows preferably along this orientation. Furthermore, the (001) diffraction peak shows a trend of first increasing and then decreasing in the 660 °C–750 °C temperature range.
Wet chemical synthesis and characterization of SnS2 …
Apr 27, 2012 · The elemental composition of the as-synthesized SnS2 nanoparticles was determined by energy dispersive analysis of X-ray. The structure and lattice parameters were determined by X-ray diffraction. The crystallite size was determined from XRD pattern using Scherrer’s formula and Hall–Williamson plot.
Synthesis and Characterization of Tin Disulfide (SnS2) Nanowires
Apr 5, 2009 · X-ray diffraction (XRD) and corresponding selected area electron diffraction (SAED) patterns demonstrate the SnS 2 nanowire is hexagonal polycrystalline. The study of UV/Visible/NIR absorption shows the SnS 2 nanowire is a wide-band semiconductor with three band gap energies (3.3, 4.4, and 5.8 eV).
Large-Scale Production and Optical Properties of a High-Quality SnS2 …
Jul 20, 2023 · X-ray diffraction (XRD) is a powerful technique for characterizing the crystal structure of materials, including SnS 2 single crystals. The XRD pattern of SnS 2 provides information about the crystal symmetry, lattice parameters, crystal quality, and orientation.
X-ray diffraction pattern of SnS 2 thin films with different ...
In this study, the SnS2 thin film deposited by spray pyrolysis technique has been analyzed by XRD, SEM and UV-visible characterization techniques to investigate of structural, morphological and...